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SS3829 Transformer Testing System
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  • SS3829 Transformer Testing System
  • SS3829 Transformer Testing System
  • SS3829 Transformer Testing System
  • SS3829 Transformer Testing System
  • SS3829 Transformer Testing System

    Product name :SS3829 All-in-One transformer tester: Stable, Efficient for Laboratory/Production Testing


    Description :

    SS3829 Series is a new, practical and cost-effective transformer testing system designed to meet customers' production and transformer characteristic testing needs; as a popular 2025 transformer industry device, it solves traditional equipment issues (low efficiency, poor stability) with faster measurement, stronger stability/reliability, and comprehensive testing functions for production lines, QC and laboratories—supporting one-time testing of core parameters like turn ratio, L, Q, L.K, ACR, Cp, DCR and pin short. User-friendly with a guided Chinese menu (easy for non-professionals), it has 500-group internal data storage and unlimited USB external storage for backup. Equipped with Handler and RS-232C interfaces for automated measurement, remote control and data transmission, it cuts enterprise production/labor costs, serving as a cost-effective transformer testing solution.

    Feature :

    1. Testing parameters: Including testing functions for inductance (L), capacitance (C), AC resistance (R), impedance (Z), DC resistance (DCR), transformer phase (PH), turn-ratio, leakage inductance (LK), pin short circuit (PS), balance (BL), etc.

    2. 7-inch 16:9 color LCD display with a resolution of 800x480, showing all test items on a single screen without the need for page flipping.

    3. Testing frequency: 20Hz-500KHz, accuracy: ±(0.01% ± 0.01Hz).

    4. Maximum testing speed up to 100 times per second with stable test results.

    5. Basic testing precision: 0.05% (1kHz/1V rms).

    6. Testing voltage: 10mV to 2V rms, with 10mV per segment.

    7. Open/short/load calibration, and flexible transformer deviation deduction methods.

    8. Three bias current modes available: EXT (external bias current source), INT100mA (built-in 100mA current card), and INT1A (built-in 1A current card).

    9. Memory and USB drive: Equipped with large internal memory, capable of storing up to 500 sets of transformer data. It also has a standard USB interface for convenient sharing and management of transformer data. Test data can be directly imported to a USB drive for viewing, editing, or processing on a computer.

    10. Scanning test: Compatible with GKT3001A test box for scanning tests of various transformer parameters.

    11. Standard 232 and HANDER interfaces, fully adaptable to automated testing. It can be built-in with 20P scanning test, reducing usage costs and making automated testing more convenient.

    12. Internal resistance modes: There are 5 internal resistance modes. Different internal resistance modes can be switched according to various testing requirements, enabling better comparison with the instrument data from upstream manufacturers.


    Order items :

    ■ SS3829 Transformer Comprehensive Tester
    ■ SS3829A Transformer Comprehensive Tester
    ■ SS3829B Transformer Comprehensive Tester
    ■ Scanning Test Box (3001A)
    ■ Scanning Test Box 3001B
    ■ Scanning Test Fixture
    ■ 4-Terminal Test Cable
    ■ 36P Data Cable
    ■ 1A Built-in Bias Current Card


    Specification :

     Model

    SS3829

    SS3829A

    SS3829B

    Main Functions


    Transformer Scanning Test

    test parameters

    Transformer Scanning Test

    L、 C、 R、 ∣Z ∣、 Y、 △、 △%、 DCR、 Turn-Ratio、 LK、 DL、 PSQ、 D、 R、 θ


    Test signal

    Testing Voltage


    Turn

    10mV～ 10V, ±10%,10mV/Step


    Others

    10mV～ 2V, ±10%,10mV/Step


    Testing Frequency


    20Hz-200KHz, ±0.01%

    20Hz-500KHz， ±0.01%

    20Hz-300KHz， ±0.01%

    Output Impedance


    100 Ω、 30 Ω、 50 Ω、 10／ 100 Ω、 10／ CC


    Measurement display range

    L.LK

    0.00001 μH～ 9999.99H


    C

    0.00001pF～ 999.999mF


    Q.D

    0.00001～ 99999


    Z.X.R

    0.00001 Ω~99.9999MΩ


    Y

    0.01nS～ 99.9999S


    θ

    -90.00～ +90.00


    DCR

    0.01mΩ~99.999MΩ


    Turn

    0.01～ 99999.99Turns(The secondary voltage is less than 100Vrms)


    Pin-short

    1 groups, between pin and pin


    Basic Accuracy

    L.LK.C.Z.X.Y.R.DCR

    0.05%（1KHz）


    Q.D

    0.0005(1KHz)


    θ

    0.03 ° (1KHz)


    Turn

    0.5%(1KHz)


    Measurement Speed (Maximum Speed)

    L.LK.C.Z.X.Y.R.D

    100meas./sec


    DCR

    75meas./sec


    Turn

    30meas./sec


    Judgment Method

    Display


    800×480 dot color LCD display


    Correction Function

    Open/Short zeroing, load correction


    Memory

    500 groups of test data settings, expandable via USB


    Equivalent circuit mode

    Series, parallel


    Trigger

    Internal, manual, external


    Management

    Password management, defective product locking


    General Specifications

    Environmental Conditions

    Temperature: 10 °C～40 °C, Humidity: 10%～90%RH


    Power consumption